Open Access
Issue
Int. J. Simul. Multidisci. Des. Optim.
Volume 2, Number 3, July 2008
Page(s) 199 - 208
DOI https://doi.org/10.1051/ijsmdo:2008027
Published online 09 December 2008
  1. M. Madou, Fundamentals of Microfabrication (CRC Press, Boca Radon, Florida, USA 1997)
  2. K.E. Petersen, IBMJ. Res. Develop. 24, 631 (1980) [CrossRef]
  3. K. Yamada, T. Kuriyuma, A novel asymmetric silicon micro-mirror for optical beam scanning display, in Proceedings of MEMS'98 (Heidelberg, Germany, pp. 110–115, 1998)
  4. R.A. Miller, W.G. Burr, SPIE 2687, 47 (1996)
  5. K.E. Petersen, Appl. Phys. Lett. 31, 521 (1977) [CrossRef]
  6. M.-H. Kiang, O. Solgaard, K.Y. Lau, J. Microelectromechanical Systems 7, 27 (1998) [CrossRef]
  7. R.W. Corrigan, Scanned linear architecture improves laser projectors, Laser Focus World (1999), pp. 169–172
  8. G. Lammel, S. Schweizer, Ph. Renaud, Optical Microscanners and Microspectrometers using Thermal Bimorph Actuators (Kluwer Academic Publishers, Boston, 2002)
  9. S. Timoshenko, J. Opt. Soc. America 11, 233 (1925)
  10. F.P. Incropera, D.P. DeWitt, Fundamentals of Heat and Mass Transfer (John Wiley & Sons, New York, 1996)
  11. W.L. Gambin, A. Zarzycki, Optimal design of a new thermally actuated microscanner of high precision, First International Conference on Multidisciplinary Design Optimisation and Application, April 17–20, (2007) EDP Sciences, ISBN 978-27598-0023-0
  12. W.L. Gambin, A. Zarzycki, Thermal and dynamical analysis of new microscanner behaviour, First International Conference on Multidisciplinary Design Optimisation and Application, April 17–20, (2007) EDP Sciences, ISBN 978-27598-0023-0

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