Reliability of the connections used in IGBT modules, in aeronautical environmentA. Zéanh, O. Dalverny, M. Karama, E. Woirgard, S. Azzopardi, A. Bouzourene, J. Casutt and M. Mermet-GuyennetInt. J. Simul. Multidisci. Des. Optim., 2 2 (2008) 123-133DOI: https://doi.org/10.1051/smdo:2008017
